Atomic force microscopy (AFM) and infrared (IR) spectroscopy have emerged as complementary techniques that enable the precise characterisation of materials at the nanoscale. AFM provides ...

Researchers in China have developed an electrical imaging technique using three-dimensional (3D) tomographic conductive atomic force microscopy (TC-AFM) to go beyond indirect characterization of ...

First invented in 1985 by IBM in Zurich, Atomic Force Microscopy (AFM) is a scanning probe technique for imaging. It involves a nanoscopic tip attached to a microscopic, flexible cantilever, which is ...

AFM can provide new insights into 2D materials to better understand their potential applications. What are the key characteristics and importance of 2D materials like graphene and hexagonal boron ...

Atomic force microscopy (AFM) is a high-resolution imaging technique that generates 3D images of sample surfaces and characterizes their nanomechanical properties. AFM can be used for several ...

Christoph Gerber, who co-invented the atomic force microscope, tells Matthew Chalmers how the AFM came about 30 years ago and why it continues to shape research at the nanoscale Nano-vision Christoph ...

The research introduces a 3D approach to visualize electrical properties in perovskite films, paving the way for enhanced ...

Perovskite solar cells have garnered widespread attention as a low-cost, high-efficiency alternative to conventional silicon ...

The NANOscientific Symposium Series (NSS) 2025 has successfully concluded its global program, bringing together the international nanoscale science and metrology community across the Americas, Europe, ...

Researchers at the Ningbo Institute of Materials Technology and Engineering (NIMTE), part of the Chinese Academy of Sciences, ...

Escherichia coli bacteria imaged by high-speed inline force mapping and fluorescence microscopy. Simultaneous topography and elastic modulus maps show a stiffening of the division site. Light and ...